| Topic | Name | Description |
|---|---|---|
| Methods of Structural Analysis | Introduction |
|
| Scanning Electron Microscopy | SEM principles, sample preparation, application |
|
| Transmission Electron Microscopy | TEM principles, electron diffraction, sample preparation |
|
| Scanning Probe Microscopy 1 | General principles of method, STM, AFM |
|
| Scanning Probe Microscopy 2 | ||
Other SPM techniques - MFM, LFM, EFM |
||
| Spectral analysis | OES principles, equipment |
|
| Electron Probe Microanalysis | Principles of method, EDX analysis, WDX analysis |
|
| Methods of surface analysis | ||
| Structural Rentgenography 1 | ||
| Structural Rentgenography 2 | Diffraction techniques, application |
